Haiying Yuan, Kun Guo, Xun Sun, Zijian Ju. A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding. J. Electronic Testing, 32(1):59-68, 2016. [doi]
@article{YuanGSJ16,
title = {A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding},
author = {Haiying Yuan and Kun Guo and Xun Sun and Zijian Ju},
year = {2016},
doi = {10.1007/s10836-016-5562-8},
url = {http://dx.doi.org/10.1007/s10836-016-5562-8},
researchr = {https://researchr.org/publication/YuanGSJ16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {1},
pages = {59-68},
}