Xin Yuan, Kevin W. McCullen, Fook-Luen Heng, Robert F. Walker, Jason Hibbeler, Robert J. Allen, Rani R. Narayan. Technology migration technique for designs with strong RET-driven layout restrictions. In Patrick Groeneveld, Louis Scheffer, editors, Proceedings of the 2005 International Symposium on Physical Design, ISPD 2005, San Francisco, California, USA, April 3-6, 2005. pages 175-182, ACM, 2005. [doi]
Abstract is missing.