Houman Zahedmanesh, Olalla Varela Pedreira, Zsolt Tokei, Kristof Croes. Electromigration limits of copper nano-interconnects. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{ZahedmaneshPTC21,
title = {Electromigration limits of copper nano-interconnects},
author = {Houman Zahedmanesh and Olalla Varela Pedreira and Zsolt Tokei and Kristof Croes},
year = {2021},
doi = {10.1109/IRPS46558.2021.9405091},
url = {https://doi.org/10.1109/IRPS46558.2021.9405091},
researchr = {https://researchr.org/publication/ZahedmaneshPTC21},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021},
publisher = {IEEE},
isbn = {978-1-7281-6893-7},
}