Saif al Zahir, Aiman El-Maleh, Esam Khan. An efficient test vector compression technique based on geometric shapes [system-on-a-chip]. In Proceedings of the 2001 8th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2001, Malta, September 2-5, 2001. pages 1561-1564, IEEE, 2001. [doi]
@inproceedings{ZahirEK01,
title = {An efficient test vector compression technique based on geometric shapes [system-on-a-chip]},
author = {Saif al Zahir and Aiman El-Maleh and Esam Khan},
year = {2001},
doi = {10.1109/ICECS.2001.957514},
url = {https://doi.org/10.1109/ICECS.2001.957514},
researchr = {https://researchr.org/publication/ZahirEK01},
cites = {0},
citedby = {0},
pages = {1561-1564},
booktitle = {Proceedings of the 2001 8th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2001, Malta, September 2-5, 2001},
publisher = {IEEE},
isbn = {0-7803-7057-0},
}