Energy-Efficient and Process-Variation-Resilient Write Circuit Schemes for Spin Hall Effect MRAM Device

Ramtin Zand, Arman Roohi, Ronald F. DeMara. Energy-Efficient and Process-Variation-Resilient Write Circuit Schemes for Spin Hall Effect MRAM Device. IEEE Trans. VLSI Syst., 25(9):2394-2401, 2017. [doi]

Abstract

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