Mahroo Zandrahimi, Alireza Zarei, Hamid R. Zarandi. A Probabilistic Method to Detect Anomalies in Embedded Systems. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 152-159, IEEE Computer Society, 2010. [doi]
Abstract is missing.