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Case study of a technology transfer causing ESD problems

F. Zängl, Harald Gossner, K. Esmark, R. Owen, G. Zimmermann. Case study of a technology transfer causing ESD problems. Microelectronics Reliability, 42(9-11):1275-1280, 2002. [doi]

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F. Zängl

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Harald Gossner

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K. Esmark

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R. Owen

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G. Zimmermann

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