F. Zängl, Harald Gossner, K. Esmark, R. Owen, G. Zimmermann. Case study of a technology transfer causing ESD problems. Microelectronics Reliability, 42(9-11):1275-1280, 2002. [doi]
@article{ZanglGEOZ02,
title = {Case study of a technology transfer causing ESD problems},
author = {F. Zängl and Harald Gossner and K. Esmark and R. Owen and G. Zimmermann},
year = {2002},
doi = {10.1016/S0026-2714(02)00134-8},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00134-8},
tags = {case study},
researchr = {https://researchr.org/publication/ZanglGEOZ02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {9-11},
pages = {1275-1280},
}