Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz. Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-10, IEEE, 2020. [doi]
@inproceedings{ZanoniMMRMZCGAS20,
title = {Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling},
author = {Enrico Zanoni and Matteo Meneghini and Gaudenzio Meneghesso and Fabiana Rampazzo and Daniele Marcon and Veronica Gao Zhan and Francesca Chiocchetta and Andreas Graff and Frank Altmann and Michél Simon-Najasek and David Poppitz},
year = {2020},
doi = {10.1109/IRPS45951.2020.9128358},
url = {https://doi.org/10.1109/IRPS45951.2020.9128358},
researchr = {https://researchr.org/publication/ZanoniMMRMZCGAS20},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}