A Global Optimization for Scan Chain Insertion at the RT-level

Lilia Zaourar, Yann Kieffer, Chouki Aktouf. A Global Optimization for Scan Chain Insertion at the RT-level. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2011, 4-6 July 2011, Chennai, India. pages 321-322, IEEE Computer Society, 2011. [doi]

Abstract

Abstract is missing.