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Gate-Level Validation of Integrated Circuits With Structured-Illumination Read-Out of Embedded Optical Signatures

Negin Zaraee, Boyou Zhou, Kyle Vigil, Mohammad M. Shahjamali, Ajay Joshi, M. Selim Ünlü. Gate-Level Validation of Integrated Circuits With Structured-Illumination Read-Out of Embedded Optical Signatures. IEEE Access, 8:70900-70912, 2020. [doi]

Authors

Negin Zaraee

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Boyou Zhou

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Kyle Vigil

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Mohammad M. Shahjamali

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Ajay Joshi

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M. Selim Ünlü

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