Gate-Level Validation of Integrated Circuits With Structured-Illumination Read-Out of Embedded Optical Signatures

Negin Zaraee, Boyou Zhou, Kyle Vigil, Mohammad M. Shahjamali, Ajay Joshi, M. Selim Ünlü. Gate-Level Validation of Integrated Circuits With Structured-Illumination Read-Out of Embedded Optical Signatures. IEEE Access, 8:70900-70912, 2020. [doi]

@article{ZaraeeZVSJU20,
  title = {Gate-Level Validation of Integrated Circuits With Structured-Illumination Read-Out of Embedded Optical Signatures},
  author = {Negin Zaraee and Boyou Zhou and Kyle Vigil and Mohammad M. Shahjamali and Ajay Joshi and M. Selim Ünlü},
  year = {2020},
  doi = {10.1109/ACCESS.2020.2987088},
  url = {https://doi.org/10.1109/ACCESS.2020.2987088},
  researchr = {https://researchr.org/publication/ZaraeeZVSJU20},
  cites = {0},
  citedby = {0},
  journal = {IEEE Access},
  volume = {8},
  pages = {70900-70912},
}