Gate-Level Validation of Integrated Circuits With Structured-Illumination Read-Out of Embedded Optical Signatures - researchr publication

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Negin Zaraee, Boyou Zhou, Kyle Vigil, Mohammad M. Shahjamali, Ajay Joshi, M. Selim Ünlü. Gate-Level Validation of Integrated Circuits With Structured-Illumination Read-Out of Embedded Optical Signatures. IEEE Access, 8:70900-70912, 2020. [doi]

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