On some properties of the convolution algorithms for the thermal analysis of semiconductor devices

Janusz Zarebski, Krzysztof Górecki. On some properties of the convolution algorithms for the thermal analysis of semiconductor devices. In Proceedings of the 2002 9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, Dubrovnik, Croatia, September 15-18, 2002. pages 371-374, IEEE, 2002. [doi]

Abstract

Abstract is missing.