Payman Zarkesh-Ha, Ken Doniger, William Loh, Peter Wright. Prediction of interconnect pattern density distribution: derivation, validation, and applications. In Dennis Sylvester, Dirk Stroobandt, Louis Scheffer, Payman Zarkesh-Ha, editors, The 5th International Workshop on System-Level Interconnect Prediction (SLIP 2003), Monterey, CA, USA, April 5-6, 2003, Proceedings. pages 85-91, ACM, 2003. [doi]
@inproceedings{Zarkesh-HaDLW03,
title = {Prediction of interconnect pattern density distribution: derivation, validation, and applications},
author = {Payman Zarkesh-Ha and Ken Doniger and William Loh and Peter Wright},
year = {2003},
doi = {10.1145/639929.639946},
url = {http://doi.acm.org/10.1145/639929.639946},
researchr = {https://researchr.org/publication/Zarkesh-HaDLW03},
cites = {0},
citedby = {0},
pages = {85-91},
booktitle = {The 5th International Workshop on System-Level Interconnect Prediction (SLIP 2003), Monterey, CA, USA, April 5-6, 2003, Proceedings},
editor = {Dennis Sylvester and Dirk Stroobandt and Louis Scheffer and Payman Zarkesh-Ha},
publisher = {ACM},
isbn = {1-58113-627-7},
}