Payman Zarkesh-Ha, Ken Doniger, William Loh, Peter Wright. Prediction of interconnect pattern density distribution: derivation, validation, and applications. In Dennis Sylvester, Dirk Stroobandt, Louis Scheffer, Payman Zarkesh-Ha, editors, The 5th International Workshop on System-Level Interconnect Prediction (SLIP 2003), Monterey, CA, USA, April 5-6, 2003, Proceedings. pages 85-91, ACM, 2003. [doi]
Abstract is missing.