Kamran Zarrineh, R. Dean Adams, Aneesha P. Deo. Defect Analysis and Realistic Fault Model Extensions for Static Random Access Memories. In 8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, CA, USA. pages 119-124, IEEE Computer Society, 2000. [doi]
Abstract is missing.