A Design For Test Perspective on I/O Management

Kamran Zarrineh, Vivek Chickermane, Gareth Nicholls, Mike Palmer. A Design For Test Perspective on I/O Management. In 1996 International Conference on Computer Design (ICCD 96), VLSI in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings. pages 46, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.