Non Stuck Fault Testing of CMOS VLSI

John J. Zasio. Non Stuck Fault Testing of CMOS VLSI. In Spring COMPCON 85, Digest of Papers, Thirtieth IEEE Computer Society International Conference, San Francisco, California, USA, February 25-28, 1985. pages 388-391, IEEE Computer Society, 1985.

Authors

John J. Zasio

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