John J. Zasio. Non Stuck Fault Testing of CMOS VLSI. In Spring COMPCON 85, Digest of Papers, Thirtieth IEEE Computer Society International Conference, San Francisco, California, USA, February 25-28, 1985. pages 388-391, IEEE Computer Society, 1985.
@inproceedings{Zasio85, title = {Non Stuck Fault Testing of CMOS VLSI}, author = {John J. Zasio}, year = {1985}, tags = {testing}, researchr = {https://researchr.org/publication/Zasio85}, cites = {0}, citedby = {0}, pages = {388-391}, booktitle = {Spring COMPCON 85, Digest of Papers, Thirtieth IEEE Computer Society International Conference, San Francisco, California, USA, February 25-28, 1985}, publisher = {IEEE Computer Society}, isbn = {0-8186-0613-4}, }