Non Stuck Fault Testing of CMOS VLSI - researchr publication

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John J. Zasio. Non Stuck Fault Testing of CMOS VLSI. In Spring COMPCON 85, Digest of Papers, Thirtieth IEEE Computer Society International Conference, San Francisco, California, USA, February 25-28, 1985. pages 388-391, IEEE Computer Society, 1985.

Abstract is missing.

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