Functional Pattern Generation for Asynchronous Designs in a Test Processor Environment

Steffen Zeidler, Christoph Wolf, Milos Krstic, Rolf Kraemer. Functional Pattern Generation for Asynchronous Designs in a Test Processor Environment. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 296-301, IEEE Computer Society, 2012. [doi]

Abstract

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