Gang Zeng, Hideo Ito. Efficient Test Data Decompression for System-on-a-Chip Using an Embedded FPGA Core. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 503-510, IEEE Computer Society, 2003. [doi]
Abstract is missing.