Deep just-in-time defect prediction: how far are we?

Zhengran Zeng, Yuqun Zhang, Haotian Zhang, Lingming Zhang. Deep just-in-time defect prediction: how far are we?. In Cristian Cadar, Xiangyu Zhang 0001, editors, ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, Denmark, July 11-17, 2021. pages 427-438, ACM, 2021. [doi]

Authors

Zhengran Zeng

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Yuqun Zhang

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Haotian Zhang

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Lingming Zhang

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