Zhengran Zeng, Yuqun Zhang, Haotian Zhang, Lingming Zhang. Deep just-in-time defect prediction: how far are we?. In Cristian Cadar, Xiangyu Zhang 0001, editors, ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, Denmark, July 11-17, 2021. pages 427-438, ACM, 2021. [doi]
@inproceedings{ZengZZZ21,
title = {Deep just-in-time defect prediction: how far are we?},
author = {Zhengran Zeng and Yuqun Zhang and Haotian Zhang and Lingming Zhang},
year = {2021},
doi = {10.1145/3460319.3464819},
url = {https://doi.org/10.1145/3460319.3464819},
researchr = {https://researchr.org/publication/ZengZZZ21},
cites = {0},
citedby = {0},
pages = {427-438},
booktitle = {ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, Denmark, July 11-17, 2021},
editor = {Cristian Cadar and Xiangyu Zhang 0001},
publisher = {ACM},
isbn = {978-1-4503-8459-9},
}