Detectability Dependency on Test Generation Process for Interconnection Opens

Antonio Zenteno, VĂ­ctor H. Champac, Joan Figueras. Detectability Dependency on Test Generation Process for Interconnection Opens. In 13th Latin American Test Workshop, LATW 2012, Quito, Ecuador, April 10-13, 2012. pages 47-53, IEEE Computer Society, 2000.

Abstract

Abstract is missing.