Moustafa Zerarka, Patrick Austin, Marise Bafleur. Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs. Microelectronics Reliability, 51(9-11):1990-1994, 2011. [doi]
@article{ZerarkaAB11,
title = {Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs},
author = {Moustafa Zerarka and Patrick Austin and Marise Bafleur},
year = {2011},
doi = {10.1016/j.microrel.2011.07.032},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.032},
researchr = {https://researchr.org/publication/ZerarkaAB11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1990-1994},
}