Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs

Moustafa Zerarka, Patrick Austin, Marise Bafleur. Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs. Microelectronics Reliability, 51(9-11):1990-1994, 2011. [doi]

Abstract

Abstract is missing.