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Yaping Zhan, Andrzej J. Strojwas, Mahesh Sharma, David Newmark. Statistical critical path analysis considering correlations. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 699-704, IEEE Computer Society, 2005.

This author has not been identified. Look up 'Yaping Zhan' in GoogleThis author has not been identified. Look up 'Andrzej J. Strojwas' in GoogleThis author has not been identified. Look up 'Mahesh Sharma' in GoogleThis author has not been identified. Look up 'David Newmark' in Google

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