Statistical critical path analysis considering correlations

Yaping Zhan, Andrzej J. Strojwas, Mahesh Sharma, David Newmark. Statistical critical path analysis considering correlations. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 699-704, IEEE Computer Society, 2005.

Abstract

Abstract is missing.