Kang Zhang, Yu Wu 0015, Dongqing Hu, Yunpeng Jia, Xintian Zhou. Improvement of reverse recovery characteristics through integration of MOS-barrier Schottky diode in SiC superjunction structure. In Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering, EITCE 2023, Xiamen, China, October 20-22, 2023. pages 1601-1608, ACM, 2023. [doi]
Abstract is missing.