Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Sharad Saxena, Andrzej J. Strojwas, Rob A. Rutenbar. Efficient Spatial Pattern Analysis for Variation Decomposition Via Robust Sparse Regression. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(7):1072-1085, 2013. [doi]
Abstract is missing.