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Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction

Xu Zhang, Libing Bai, Jie Zhang 0086, Yiping Liang, Yuhua Cheng 0001, Lulu Tian, Yong Duan. Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction. IEEE Trans. Industrial Informatics, 20(2):1862-1870, February 2024. [doi]

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Xu Zhang

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Libing Bai

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Jie Zhang 0086

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Yiping Liang

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Yuhua Cheng 0001

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Lulu Tian

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Yong Duan

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