Xu Zhang, Libing Bai, Jie Zhang 0086, Yiping Liang, Yuhua Cheng 0001, Lulu Tian, Yong Duan. Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction. IEEE Trans. Industrial Informatics, 20(2):1862-1870, February 2024. [doi]
@article{ZhangBZLCTD24,
title = {Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction},
author = {Xu Zhang and Libing Bai and Jie Zhang 0086 and Yiping Liang and Yuhua Cheng 0001 and Lulu Tian and Yong Duan},
year = {2024},
month = {February},
doi = {10.1109/TII.2023.3282312},
url = {https://doi.org/10.1109/TII.2023.3282312},
researchr = {https://researchr.org/publication/ZhangBZLCTD24},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {20},
number = {2},
pages = {1862-1870},
}