Xu Zhang, Libing Bai, Jie Zhang 0086, Yiping Liang, Yuhua Cheng 0001, Lulu Tian, Yong Duan. Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction. IEEE Trans. Industrial Informatics, 20(2):1862-1870, February 2024. [doi]
Abstract is missing.