Ying Zhang, Krishnendu Chakrabarty, Huawei Li, Jianhui Jiang. Software-based online self-testing of network-on-chip using bounded model checking. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]
Abstract is missing.