Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi. Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 48-56, IEEE Computer Society, 2004. [doi]
Abstract is missing.