Ruilin Zhang, Sijia Chen, Chao Wan, Hirofumi Shinohara. High-throughput Von Neumann post-processing for random number generator. In 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018. pages 1-4, IEEE, 2018. [doi]
Abstract is missing.