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Nondestructive Incipient Crack Detection based on Wavelet and Jensen-Shannon Divergence in the NICA framework

Xiaoxia Zhang, Claude Delpha, Demba Diallo. Nondestructive Incipient Crack Detection based on Wavelet and Jensen-Shannon Divergence in the NICA framework. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 3685-3690, IEEE, 2019. [doi]

Authors

Xiaoxia Zhang

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Claude Delpha

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Demba Diallo

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