Xiaoxia Zhang, Claude Delpha, Demba Diallo. Nondestructive Incipient Crack Detection based on Wavelet and Jensen-Shannon Divergence in the NICA framework. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 3685-3690, IEEE, 2019. [doi]
Abstract is missing.