Xiaoxia Zhang, Claude Delpha, Demba Diallo. Nondestructive Incipient Crack Detection based on Wavelet and Jensen-Shannon Divergence in the NICA framework. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 3685-3690, IEEE, 2019. [doi]
@inproceedings{ZhangDD19-2,
title = {Nondestructive Incipient Crack Detection based on Wavelet and Jensen-Shannon Divergence in the NICA framework},
author = {Xiaoxia Zhang and Claude Delpha and Demba Diallo},
year = {2019},
doi = {10.1109/IECON.2019.8927638},
url = {https://doi.org/10.1109/IECON.2019.8927638},
researchr = {https://researchr.org/publication/ZhangDD19-2},
cites = {0},
citedby = {0},
pages = {3685-3690},
booktitle = {IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4878-6},
}