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Ying Zhang 0040, Yi Ding, Zebo Peng, Huawei Li, Masahiro Fujita, Jianhui Jiang. BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature. IEEE Trans. VLSI Syst., 30(11):1677-1690, 2022. [doi]
Abstract is missing.