Yield estimation and statistical design of memristor cross-point memory systems

Jizhe Zhang, Sandeep K. Gupta. Yield estimation and statistical design of memristor cross-point memory systems. In 17th International Symposium on Quality Electronic Design, ISQED 2016, Santa Clara, CA, USA, March 15-16, 2016. pages 95-100, IEEE, 2016. [doi]

Authors

Jizhe Zhang

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Sandeep K. Gupta

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