Jizhe Zhang, Sandeep K. Gupta. Yield estimation and statistical design of memristor cross-point memory systems. In 17th International Symposium on Quality Electronic Design, ISQED 2016, Santa Clara, CA, USA, March 15-16, 2016. pages 95-100, IEEE, 2016. [doi]
@inproceedings{ZhangG16-11, title = {Yield estimation and statistical design of memristor cross-point memory systems}, author = {Jizhe Zhang and Sandeep K. Gupta}, year = {2016}, doi = {10.1109/ISQED.2016.7479182}, url = {http://dx.doi.org/10.1109/ISQED.2016.7479182}, researchr = {https://researchr.org/publication/ZhangG16-11}, cites = {0}, citedby = {0}, pages = {95-100}, booktitle = {17th International Symposium on Quality Electronic Design, ISQED 2016, Santa Clara, CA, USA, March 15-16, 2016}, publisher = {IEEE}, isbn = {978-1-5090-1213-8}, }