Robust counterfeit PCB detection exploiting intrinsic trace impedance variations

Fengchao Zhang, Andrew Hennessy, Swarup Bhunia. Robust counterfeit PCB detection exploiting intrinsic trace impedance variations. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]

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