Min Zhang, Zhijian Hou, Hongwei Bai, Qiufeng Yao. An on-line thickness measurement system based on TMS32DF2812. In International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011. pages 4760-4762, IEEE, 2011. [doi]
@inproceedings{ZhangHBY11,
title = {An on-line thickness measurement system based on TMS32DF2812},
author = {Min Zhang and Zhijian Hou and Hongwei Bai and Qiufeng Yao},
year = {2011},
doi = {10.1109/EMEIT.2011.6024100},
url = {http://dx.doi.org/10.1109/EMEIT.2011.6024100},
researchr = {https://researchr.org/publication/ZhangHBY11},
cites = {0},
citedby = {0},
pages = {4760-4762},
booktitle = {International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011},
publisher = {IEEE},
isbn = {978-1-61284-087-1},
}