Min Zhang, Zhijian Hou, Hongwei Bai, Qiufeng Yao. An on-line thickness measurement system based on TMS32DF2812. In International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011, Harbin, Heilongjiang, China, 12-14 August, 2011. pages 4760-4762, IEEE, 2011. [doi]
Abstract is missing.