A DFT-Compatible In-Situ Timing Error Detection and Correction Structure Featuring Low Area and Test Overhead - researchr publication authors

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Hao Zhang, Weifeng He, Yanan Sun 0003, Mingoo Seok. A DFT-Compatible In-Situ Timing Error Detection and Correction Structure Featuring Low Area and Test Overhead. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(3):1015-1028, March 2023. [doi]

This author has not been identified. Look up 'Hao Zhang' in GoogleThis author has not been identified. Look up 'Weifeng He' in GoogleThis author has not been identified. Look up 'Yanan Sun 0003' in GoogleThis author has not been identified. Look up 'Mingoo Seok' in Google

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