A DFT-Compatible In-Situ Timing Error Detection and Correction Structure Featuring Low Area and Test Overhead - researchr publication

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Hao Zhang, Weifeng He, Yanan Sun 0003, Mingoo Seok. A DFT-Compatible In-Situ Timing Error Detection and Correction Structure Featuring Low Area and Test Overhead. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(3):1015-1028, March 2023. [doi]

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