Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian. Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 145-150, IEEE Computer Society, 2017. [doi]
Abstract is missing.